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Test Pattern Generation for Jump Bit Insertion in Scan Diagnosis

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Scan chain failures accounts for about 30% of chip failures. Scan chain diagnosis is complex because of limited observability. A single scan chain consists of large number of flip-flops (scan cells). Scan chain diagnosis approaches identify candidate cells. All the methods developed so far attempts to reduce the range of candidate cells, by identifying an upper bound and a lower bound. In this paper we propose a method to identify the candidate cell by bit insertion and simulation technique. The effectiveness of the approach is verified by experiments on ISCAS’89 benchmark circuits.
Keywords:Testing, diagnosis,scan architecture, flush test, capture cycle.


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